A Comprehensive Tutorial on Graphene Family X-ray Diffraction Analysis
Graphical Representation of Miller Indices
DOI:
https://doi.org/10.58341/srj.v3i2.54Abstract
This study analyzes X-ray diffraction (XRD) patterns of graphene, graphene oxide, and reduced graphene oxide, identifying key crystallographic planes and their corresponding interplanar spacing through Miller indices. Graphene exhibits peaks for (002) and (004) planes, while graphene oxide shows peaks for (001) || (004) ⊥ (100) planes. Reduced graphene oxide has peaks for (002) and (001) planes. All findings are visually represented with unit cells, providing a valuable educational tool for understanding XRD patterns and the structure of the graphene family.
Keywords:
Diffraction, miller indices, unit cell, planes direction
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